Metallurgy and Materials Science - MET 248
Scanning Electron Microscopy and X-ray Microanalysis
3 Credit Hours2 Lecture Hours2 Laboratory Hours
This course introduces the fundamentals of Scanning Electron Microscopy (SEM) and X-ray Microanalysis used for materials characterization and failure analysis. Topics include microscopy systems and components, safety and maintenance, applications in fractography and materials characterization and failure analysis.
(A requirement that must be completed before taking this course.)
Upon successful completion of the course, the student should be able to:
- Investigate the application of Scanning Electron Microscopy in the field of materials science.
- Investigate the application of X-ray microanalysis in the field of materials science.
- Operate the SEM and related equipment to mount, image and analyze metallic and/or inorganic specimens with secondary electron imaging.
- Operate the SEM and related equipment to mount, image and analyze metallic and/or inorganic specimens with backscattered electron imaging.
- Operate the Energy Dispersive Spectrometer (EDS) and/or Wavelength Dispersive Spectrometer (WDS) to analyze the elemental composition of metallic and/or inorganic specimens.
- Explore the principles and operation of electron optics.
- Explore the electron beam/specimen interaction.
- Demonstrate routine and preventative maintenance associated with daily operation of the SEM.
- Interpret characteristic features of various fracture surface morphologies.
- Investigate the principles of failure analysis as related to the study of materials science.
- Demonstrate safety skills as related to high voltage, vacuum systems, X-radiation and gas cylinders.
- Summarize data in standard laboratory report format.
| ||248||144953||Scan Elect Micros||HYBMC||3||Sun H||6/7/0||Open||$235.00||T R 06:00 PM-08:26 PM BTC175
Key: Day of the Week
- T = Tuesday
- R = Thursday
- S = Saturday
- X = Sunday